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When repairing various electronic devices, do you often get helpless due to incomplete drawings and data? Do you often worry about high maintenance costs?
[ICT] series detectors help you to solve the troubles in circuit board repair. With the use of computers, all intelligent. It uses a computer to make up for the lack of manual maintenance capabilities, and can perform ASA analysis or ICT testing on various types of circuit boards to check the quality of components online when the maintenance personnel lack drawings and information or do not know the working principle of the circuit board. Quickly detect faulty components on the circuit board. Easy and economical repair of various types of circuit boards.
Features:
◆ Advanced testing technology, powerful driving ability, any circuit board with any cause of failure can be repaired ◆ Friendly and simple Chinese operation interface, no professional training, anyone can become a maintenance expert ◆ No circuit schematic, no need to know the device model, Quickly repair any circuit board ◆ 40/40 × 2 digital circuit test function, equipped with TTL / CMOS / RAM and medium-scale integrated circuit database;
◆ 40/40 × 2 （ASA） V / I, curve analysis test function ◆ The circuit board test storage function, the tested board can be compared with it ◆ Compared with imported similar instruments, the cost performance is better, the operation is more convenient ◆ Generally used in various types Dual in-line packaged chips can provide analysis and testing for large and medium scale integrated circuits.
â—† This function can also be tested through learning records and comparative analysis.
Technical specifications:
ICT-4040XP
parallel port
The Windows interface can work under dual systems such as WIN98, WIN2000, WIN XP, etc., with faster speed and higher efficiency.
Function test 40 × 2 channels
VI curve test 40 × 2 channel dual test clip VI curve test network extraction program-controlled power-on
EPROM / RAM online reading analog device VI curve test bus isolation signal Chinese maintenance notes
â—† [ICT] series detectors are more reliable and accurate
â– The function test software has a pull-up resistor-it is convenient for the test of the open collector door â– The function test external power supply is stable and reliable-all kinds of large, medium and small circuit boards can be tested â– The function test has a three-state recognition ability- -Can measure the failure of three-state device and IC load capacity drop â– V / I test positive and negative scan voltage-simultaneously check positive / reverse V / I curve â– V / I test six scan frequencies-ensure V / I curve test Stable and reliable â– Three test voltage ranges for V / I test-to ensure V / I test for various devices
â—† On-line functional test of integrated circuits
This function adopts the post-drive isolation technology, which can determine whether the IC logic function is correct online. It can measure 74 series,
Over 4000 kinds of integrated circuits such as 4000/45000 logic IC, 75 series interface IC and various memories. 1. Quick test: directly display the test results and quickly determine the suspicious IC 2. Analyze test: display the entire test process and test incentives. Expected and actual response to help analyze the cause of the failure 3. Device identification: Find unmarked model ICs or ICs of different models with the same function.
â—† IC online status test
By comparing the status of the corresponding IC on the good and bad boards, find the faulty IC. 1. State learning: online learning of pin relationships of fault-free ICs, interconnection status and test stimulus and response, and stored in the database 2. Status comparison: online status comparison with the corresponding IC on the faulty board, according to the difference Determine whether the IC is good or bad 3. Status display: display the status data of each IC stored in the computer library.
â—† Off-line functional test of integrated circuits
Offline test IC function is good or bad, automatic identification of unknown model chips
â—† V / I curve test
Determine the faulty node and fault IC by the similarities and differences of the dynamic impedance loops of the corresponding nodes on the good and bad boards 1. Curve learning: Online learning of the dynamic impedance curve (V / I curve) of each node on the fault-free board and store it in the database Curve comparison: compare with the dynamic impedance curve of the corresponding node on the fault board, and determine the IC related to this node according to the difference size and maintenance experience
Whether it is damaged 3. Curve display: display the dynamic impedance graph data of each node on the circuit board stored in the computer library. Large-scale integrated circuit analysis and testing
â—† Network extraction test
Allows users to easily test the connection relationship between components; assists in determining the quality of the chip. Four modes are used to achieve network extraction:
1. Probe to probe ("stick"-"stick" mode)
2. Explore the pair of test clips ("stick"-"clamp" mode)
3. Test clip pair probe ("clip"-"stick" mode)
4. Test clip to test clip ("clip"-"clip" mode)
â—† Development and compilation
TVED has arranged a description file for each sub-test of each circuit. The description file can be created by any text editor, and after conversion according to TVED requirements, it can be associated with the corresponding sub-test, and the corresponding description file can be viewed at any time with the hot key.
1. TVED allows two to establish test patterns and methods
a) Establish directly on the TVED graphical interface
b) Read the compilation result of DCL language
2. Edit the test pattern Use the waveform editing function provided by TVED, and refer to the retrieved response to continuously adjust and modify the test pattern.
3. 4 test methods:
a) Perform a complete test
b) Perform part of a test
c) Loop execution
d) Single step operation
Remark information:
Compared with the old 4040/8080, the following functions are added:
â—† Network extraction test
Allows users to easily test the connection relationship between components; assists in determining the quality of the chip. Four modes are used to achieve network extraction:
1. Probe to probe ("stick"-"stick" mode)
2. Explore the pair of test clips ("stick"-"clamp" mode)
3. Test clip pair probe ("clip"-"stick" mode)
4. Test clip to test clip ("clip"-"clip" mode)
â—† Development and compilation
TVED has arranged a description file for each sub-test of each circuit. The description file can be created by any text editor, and after conversion according to TVED requirements, it can be associated with the corresponding sub-test, and the corresponding description file can be viewed at any time with the hot key.
1. TVED allows two to establish test patterns and methods
a) Establish directly on the TVED graphical interface
b) Read the compilation result of DCL language
2. Edit the test pattern Use the waveform editing function provided by TVED, and refer to the retrieved response to continuously adjust and modify the test pattern.
3. 4 test methods:
a) Perform a complete test
b) Perform part of a test
c) Loop execution
d) Single step operation
New product features:
The new ICT-4040UXP (ICT4040UXP) can work under WIN98, WIN2000, WIN XP and other systems, dual CPU work, faster speed, higher efficiency, can test three-terminal devices, support USB interface.